Electrons interact strongly with matter, so much so that multiple scattering is nearly always present. Multiple scattering for core-loss edges in the electron energy-loss spectroscopy (EELS) signal is dominated by electrons that have lost a few to tens of eV of energy (the low loss) followed by a large energy-loss event into a core-loss edge. This takes the form of a one-directional smearing or convolution of the edge towards higher energies. This distorts the edge shape making edge identification problematic and quantifying overlapping edges nearly impossible. However, if the low-loss distribution is available together with the core-loss data, the effects of multiple scattering can be corrected.

In this webinar, we discuss Gatan’s DualEELS™ hardware and the methodology used to acquire low-loss and core-loss data. Gatan’s DualEELS leverages our 100 ns shutter technology and ultra-fast drift-tube supply to create a fully integrated and efficient DualEELS workflow. We also demonstrate how DigitalMicrograph® integrates DualEELS into quantitative data analysis to account for multiple scattering. Take full advantage of the strong electron interaction without being hobbled by multiple scattering.