The launch event for the Erying Material Center's new Helios 5 UX dual-beam FIB/SEM: a state-of-the-art scanning electron microscope and focused ion beam instrument excellent for high-quality TEM lamella preparation, slice-and-view imaging of nano samples, low keV SEM imaging, and much, much more.

For more information on this instrument and others within our facility, please visit: https://cores.research.asu.edu/materi...