Identifying the crystal structure and crystal structure changes in a material is key to understanding the measured properties – did my synthesis yield the desired product? Has my electrode corroded or intercalated ions? How thick are my thin films? What is in this rock I found? All these questions and more can be answered with X-ray diffraction (XRD), a technique sensitive to the interatomic spacing of atoms in crystalline (and amorphous) materials. COSINC has two instruments capable of performing XRD measurements in a variety of sample environments. This webinar will explain the applications of XRD considering the capabilities and requirements of both instruments. I will provide guidance on sample preparation and measurement setup for a variety of samples; therefore, this webinar is useful to both new and current XRD users.